For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical ...

Atomic Force Microscopy (AFM) is pivotal in nanoscience, offering high-resolution imaging and manipulation for advancements in semiconductors and life sciences.

A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...

While probing single molecules or atoms typically requires liquid helium—a costly resource—to build a stable environment, a new development from a joint Chinese research team changes the game. By ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

A pair of studies from Argonne National Laboratory, published in recent months, have given physicists two new ways to peer ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...