New research paper titled “Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification” from researchers at University of Bristol and Infineon Technologies. “Constrained ...
Constrained-random verification (CRV) offers a highly effective way to deal with the challenges of microprocessor verification. These verification challenges are overwhelming for many reasons: complex ...
Verification is the single biggest challenge in the design of system-on-chip (SoC) devices and reusable IP blocks. Traditional verification methods struggle to keep pace with the ever-increasing size ...
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