Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

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Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

Cells naturally operate on the nanoscale level, with molecules combining together to form complex molecular machines, which can work together to enable normal cell function or go wrong as in the case ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...