EurekAlert!

Lunar dust dynamics: Unveiling the charging properties and particle behavior of Chang’e-5 samples in an electric field

(a) The micro-examination and (b)–(e) SEM observations of the surface of MLI after collided by CE5 LS particles; (f) the micro-examination and (g)–(h) SEM observations of the surface of Aramid cloth ...
AZOM

Vitamin C Particle Mapping with SEM and AFM Technology

Vitamin C tablets’ surface roughness is key to defining their surface morphology and, therefore, their delivery rate and interaction time with external stimuli. Surface roughness can be observed via ...
AZoNano

Enhancing SPM and SEM Particle Size Analysis – The Improved SPIP 6.7

SPIPTM TM version 6.7 enables easy and robust particle analysis in SEM and SPM images, thanks to the new and enhanced detection and splitting options. Using the new Circle Detection method, SPIPTM 6.7 ...
Semiconductor Engineering

EUV Lithography: Results of Single Particle Volume Charging Processes in EUV Exposure Environment With Focus On Afterglow Effects

A new technical paper titled “Particle charging during pulsed EUV exposures with afterglow effect” was published by researchers at ASML, ISTEQ B.V., and Eindhoven University of Technology. “The ...
AZoNano

Zetasizer Ultra - Advanced Particle and Molecular Size, Particle Charge and Particle Concentration Measurement

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The new Zetasizer Ultra is Malvern ...
AZOM

Forensic Insights: Analyzing Glass Particles from Smartphone Damage using SEM, EDS, and Micro-CT

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...