BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

The semiconductor industry is experiencing significant growth, and its proliferation has placed more urgency on the need to completely eliminate defects from the manufacturing chain. Currently, ...

HILLSBORO, Ore.--(BUSINESS WIRE)--Thermo Fisher Scientific, the world leader in serving science, has introduced the Thermo Scientific™ Meridian™ EX System— an electron-beam-based failure analysis ...

KLA Corporation’s fiscal Q4 32.2% revenue growth from 5nm node ramps in 2022 topped the major equipment suppliers. KLA dominates the metrology/inspection sector with a greater than 55% share. KLA’s ...

Big Data Analytics in Semiconductor and Electronics Market · GlobeNewswire Inc. Dublin, Jan. 28, 2026 (GLOBE NEWSWIRE) -- The "Big Data Analytics in Semiconductor and Electronics Market Report 2026" ...

The semiconductor industry thrives on precision and innovation, as every nanometer can make the difference between groundbreaking performance and obsolescence. In this hyper-competitive landscape, ...