A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...
Mixed-cell-height standard cell design and subsequent legalization represent critical steps in modern integrated circuit development. The technique involves the utilisation of standard cells with ...
Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
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