When discussing product quality in integrated circuits (ICs), two key aspects are essential: time zero defects and reliability. These concepts help distinguish between issues that appear immediately ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results