With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM ...

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

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ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see ...

What is High-Resolution Transmission Electron Microscopy (HRTEM)? High-resolution transmission electron microscopy (HRTEM) is an advanced imaging technique that enables the direct visualization of ...

Recently, a research team resolved the contradiction between spatial resolution and imaging speed in optical microscopy. They achieved high-speed super-resolution by developing an effective technique ...

Metalenses represent a revolutionary advancement in optical technology. Unlike conventional microscope objectives that rely on curved glass surfaces, metalenses employ nanoscale structures to ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...