The Lancet

Machine learning prediction of 1-year mortality in older patients with heart failure: a nationwide, multicenter, prospective cohort study

A machine learning model incorporating functional assessments predicts one-year mortality in older patients with HF and improves risk stratification beyond established scores. Functional status at ...
Open Heart

Bridging machine learning and clinical practice: a multicentre nomogram for 90-day graft failure risk stratification in heart transplantation

Background Early graft failure within 90 postoperative days is the leading cause of mortality after heart transplantation. Existing risk scores, based on linear regression, often struggle to capture ...
Visual Studio Magazine

Linear Regression with Pseudo-Inverse Training Using JavaScript

Dr. James McCaffrey presents a complete end-to-end demonstration of linear regression with pseudo-inverse training implemented using JavaScript. Compared to other training techniques, such as ...
Frontiers

Integrated transcriptomic and machine learning analysis reveals novel diagnostic biomarkers for adolescent major depressive disorder

Introduction: The lack of objective biomarkers and mechanistic understanding of adolescent Major Depressive Disorder (MDD) impedes early diagnosis and targeted intervention. Methods: To elucidate ...
Scientific Research Publishing

AI Assisted Material Selection Framework for Corrosion Resistant Steels in Onshore Oil and Gas Pipelines ()

(2026) AI Assisted Material Selection Framework for Corrosion Resistant Steels in Onshore Oil and Gas Pipelines. Open Journal ...
IEEE

A Machine Learning and Linear Regression Based Study of Momentum Changes and Impacts

Abstract: This paper explores the changes and effects of momentum in tennis matches, and introduces indicators such as "leverage", "turning point" and "leverage momentum" to construct a classification ...
IEEE

Spatial Modeling with Automated Machine Learning and Gaussian Process Regression Techniques for Imputing Wafer Acceptance Test Data

Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...