At times physical design engineers find it difficult to relate with the additional timing modes introduced in PnR due to DFT insertion. These additional timing modes and related issues could be ...

A new concept can execute the same boundary scan test pattern on various ATE systems without modification. Boundary scan is well established and widely used for various board- and system-level test ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

With the increasing complexity in design in the semiconductor industry and advanced lower technology nodes, it is important as a DFT architecture design and service engineer to signoff the chip with ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the ...